Renate Hiesgen, Dieter Meissner, W. Schmickler,
"Tip Effects in the Scanning Tunneling Microscopy of Semiconductor Electrodes"
, in Surface Science, 1-2001, ISSN: 0039-6028, Tip Effects in the Scanning Tunneling Microscopy of Semiconductor Electrodes, R. Hiesgen, D. Meissner, W. Schmickler, Surface Science 479 (2001), 183-190
Original Titel:
Tip Effects in the Scanning Tunneling Microscopy of Semiconductor Electrodes
Sprache des Titels:
Deutsch
Journal:
Surface Science
Erscheinungsmonat:
1
Erscheinungsjahr:
2001
Notiz zum Zitat:
Tip Effects in the Scanning Tunneling Microscopy of Semiconductor Electrodes, R. Hiesgen, D. Meissner, W. Schmickler, Surface Science 479 (2001), 183-190