Wolfgang Jantsch, N. Sandersfeld, Friedrich Schäffler, Z. Wilamowski,
"Evidence for screening breakdown near the metal-to-insulator transition in two dimensions"
, 2001, W. Jantsch, Z. Wilamowski, N. Sandersfeld, F. Schäffler: Evidence for screening breakdown near the metal-to-insulator transition in two dimensions, Proceedings 25th International Conference on the Physics of Semiconductors, Sept. 2000, Osaka, Japan, edited by N. Miura, T. Ando, Berlin Heidelberg New York, Springer 2001, p. 859-860.
Original Titel:
Evidence for screening breakdown near the metal-to-insulator transition in two dimensions
Sprache des Titels:
Englisch
Englischer Titel:
Evidence for screening breakdown near the metal-to-insulator transition in two dimensions
Erscheinungsjahr:
2001
Notiz zum Zitat:
W. Jantsch, Z. Wilamowski, N. Sandersfeld, F. Schäffler: Evidence for screening breakdown near the metal-to-insulator transition in two dimensions, Proceedings 25th International Conference on the Physics of Semiconductors, Sept. 2000, Osaka, Japan, edited by N. Miura, T. Ando, Berlin Heidelberg New York, Springer 2001, p. 859-860.
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-