Timm Ostermann, Daniel Schneider, Christian Bacher, Bernd Deutschmann, Roland Jungreithmair, Wolfgang Gut, Christoph Lackner, Rüdiger Kössl, Richard Hagelauer,
"Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM cell method (IEC 61967-2)"
, 11-2002, T. Ostermann, D. Schneider, C. Bacher, B. Deutschmann, R. Jungreithmair, W. Gut,
C. Lackner, R. Kössl, R. Hagelauer: "Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM cell method (IEC 61967-2)" 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, 14-15. Nov. 2002, Toulouse, France, 2002
Original Titel:
Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM cell method (IEC 61967-2)
Sprache des Titels:
Englisch
Erscheinungsmonat:
11
Erscheinungsjahr:
2002
Notiz zum Zitat:
T. Ostermann, D. Schneider, C. Bacher, B. Deutschmann, R. Jungreithmair, W. Gut,
C. Lackner, R. Kössl, R. Hagelauer: "Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM cell method (IEC 61967-2)" 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, 14-15. Nov. 2002, Toulouse, France, 2002
Forschungs-