B. J. Kim, Y. Matsui, S. Horiuchi, D. Y. Jeong, Christian Deinhofer, Gerhard Gritzner,
"High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate"
, in Applied Physics Letters, Vol. 85, Nummer 20, Seite(n) 4627-4629, 2004, ISSN: 0003-6951, High-Resolution TEM analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate,
Bong-Jun Kim, Yoshio Matsui, Shigeo Horiuchi, Dae-Yeong Jeong, Christian Deinhofer and Gerhard Gritzner,
Appl. Phys. Lett., 85 (2004) 4627 - 4629
Original Titel:
High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate
Sprache des Titels:
Englisch
Original Kurzfassung:
The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the {113} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted {113}
planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.
Sprache der Kurzfassung:
Englisch
Englischer Titel:
High-Resolution TEM analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate
Englische Kurzfassung:
The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the {113} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted {113}
planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.
Journal:
Applied Physics Letters
Volume:
85
Number:
20
Seitenreferenz:
4627-4629
Erscheinungsjahr:
2004
Notiz zum Zitat:
High-Resolution TEM analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate,
Bong-Jun Kim, Yoshio Matsui, Shigeo Horiuchi, Dae-Yeong Jeong, Christian Deinhofer and Gerhard Gritzner,
Appl. Phys. Lett., 85 (2004) 4627 - 4629
Forschungs-