S. Schwarzer, Martin Vossiek, Markus Pichler, Andreas Stelzer,
"Precise Distance Measurement with IEEE 802.15.4 (ZigBee) Devices"
, in IEEE: IEEE Radio Wireless Symposium 2008 (RWS), Seite(n) 779 - 782, 1-2008, ISBN: 978-1-4244-1463-5
Original Titel:
Precise Distance Measurement with IEEE 802.15.4 (ZigBee) Devices
Sprache des Titels:
Englisch
Original Buchtitel:
IEEE Radio Wireless Symposium 2008 (RWS)
Original Kurzfassung:
In modern wireless communications products it is required to incorporate more and more different functions to comply with current market trends. A very attractive function with steadily growing market penetration is local positioning. To add this feature to low-cost mass-market devices without additional power consumption, it is desirable to use commercial communication chips and standards for localization of the wireless units. In this paper we present a concept to measure the distance between two IEEE 802.15.4 (ZigBee) compliant devices. The presented prototype hardware consists of a low- cost 2.45 GHz ZigBee chipset. For localization we use standard communication packets as transmit signals. Thus simultaneous data transmission and transponder localization is feasible. To achieve high positioning accuracy even in multipath environments, a coherent synthesis of measurements in multiple channels and a special signal phase evaluation concept is applied. With this technique the full available ISM bandwidth of 80 MHz is utilized. In first measurements with two different frequency references-a low-cost oscillator and a temperatur-compensated crystal oscillator-a positioning bias error of below 16 cm and 9 cm was obtained. The standard deviation was less than 3 cm and 1 cm, respectively. It is demonstrated that compared to signal correlation in time, the phase processing technique yields an accuracy improvement of roughly an order of magnitude.
Sprache der Kurzfassung:
Englisch
Seitenreferenz:
779 - 782
Erscheinungsmonat:
1
Erscheinungsjahr:
2008
ISBN:
978-1-4244-1463-5
Anzahl der Seiten:
1
Notiz zur Publikation:
Digital Object Identifier: 10.1109/RWS.2008.4463608
Orlando, Florida, USA, Jan. 22 - 24, 2008