Characterization of Differential Transmission Lines for Integrated Millimeter-Wave Applications
Sprache des Titels:
This letter focuses on the characterization of differential transmission lines (T-lines) typically used in millimeter-wave integrated circuits. Common- and differential-mode propagation constants were calculated and validated in two experimental steps. A four-port scattering parameter (S-parameter) measurement followed by a multi-line calibration was performed. In addition, several two-port S-parameter measurements were conducted using a set of three marchand baluns. Comparison of the values extracted from simulations and two experiments shows very good agreement over a broad frequency range from 65 to 170 GHz.