Optical Profilometer for Quality Control of Soldering Joints
Sprache des Titels:
Proceedings of the XX IMEKO World Congress
A low cost 3D non?contacting profile scanning method for both specular and diffuse reflecting surfaces will be presented. The resolution in x? and y?directions is about 650 nm and 1 µm in out of plane direction. The method is based on a commercially available CD pickup head. The CD pickup head will be driven in a way that the error of focus signal is used for an out of plane measurement (optical pro-filometer). Theoretical relations as well as mea-surement results will be shown in this proposed paper.