Ebrahim Ghanbari, Thorsten Wagner, Peter Zeppenfeld,
"Layer-resolved evolution of organic thin films monitored by photoelectron emission microscopy and optical reflectance spectroscopy"
, in The Journal of Physical Chemistry C, Vol. 119, Seite(n) 24174, 2015, ISSN: 1932-7455
Original Titel:
Layer-resolved evolution of organic thin films monitored by photoelectron emission microscopy and optical reflectance spectroscopy