J. Böhrer, Günther Bauer, A. Krost, R. Roehle,
"Strain distribution in InP/InGaAs superlattice structure determined by high resolution x-ray diffraction"
, in Applied Physics Letters, 1994, ISSN: 0003-6951, A. Krost, J. Böhrer, R. Roehle, G. Bauer: "Strain distribution in InP/InGaAs superlattice structure determined by high resolution x-ray diffraction", Appl. Phys. Lett. 64, 469 (1994), ISSN-Number 0003-6951
Original Titel:
Strain distribution in InP/InGaAs superlattice structure determined by high resolution x-ray diffraction
Sprache des Titels:
Englisch
Journal:
Applied Physics Letters
Erscheinungsjahr:
1994
Notiz zum Zitat:
A. Krost, J. Böhrer, R. Roehle, G. Bauer: "Strain distribution in InP/InGaAs superlattice structure determined by high resolution x-ray diffraction", Appl. Phys. Lett. 64, 469 (1994), ISSN-Number 0003-6951
ISSN:
0003-6951
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift