Günther Bauer, P. Hamberger, Vaclav Holy, E. Kasper, H. Kibbel, E. Koppensteiner, H. Presting,
""Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction""
, 1994, E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction", Solid State Electronics 37, 629 (1994)
Original Titel:
"Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction"
Sprache des Titels:
Englisch
Englischer Titel:
Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction
Erscheinungsjahr:
1994
Notiz zum Zitat:
E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction", Solid State Electronics 37, 629 (1994)
Forschungs-