Günther Bauer, P. Hamberger, Vaclav Holy, E. Kasper, H. Kibbel, E. Koppensteiner, H. Presting,
""X-ray triple crystal diffractometry of structural defects in SimGen superlattices""
, 1994, E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "X-ray triple crystal diffractometry of structural defects in SimGen superlattices", 17th International Conference on Defects in Semiconductors, Gmunden, Austria 1993; Materials Science Forum 143-147, 1325 (1994)
Original Titel:
"X-ray triple crystal diffractometry of structural defects in SimGen superlattices"
Sprache des Titels:
Englisch
Englischer Titel:
X-ray triple crystal diffractometry of structural defects in SimGen superlattices
Erscheinungsjahr:
1994
Notiz zum Zitat:
E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "X-ray triple crystal diffractometry of structural defects in SimGen superlattices", 17th International Conference on Defects in Semiconductors, Gmunden, Austria 1993; Materials Science Forum 143-147, 1325 (1994)
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-