Günther Bauer, D. Bimberg, A. A. Darhuber, Marius Grundmann, F. Heinrichsdorff, Vaclav Holy, P.S. Kop'ev, A. Krost, Julian Stangl, V.M. Ustinov,
""Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity""
, 1996, A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, F. Heinrichsdorff, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev: "Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity", Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, July 21-26, 1996, World Scientific Publishing, Singapore 1996, p. 1293-1296
Original Titel:
"Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity"
Sprache des Titels:
Englisch
Englischer Titel:
Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity
Erscheinungsjahr:
1996
Notiz zum Zitat:
A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, F. Heinrichsdorff, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev: "Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity", Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, July 21-26, 1996, World Scientific Publishing, Singapore 1996, p. 1293-1296
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-