Günther Bauer, D. Bimberg, A. A. Darhuber, Marius Grundmann, Vaclav Holy, P.S. Kop'ev, A.O. Kosogov, A. Krost, Julian Stangl, V.M. Ustinov, Peter Werner,
""Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques""
, 1997, ISSN: 0040-6090, A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev, A.O. Kosogov, P. Werner: "Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques", Thin Solid Films, 306, 198-204 (1997), ISSN-Number 0040-6090
Original Titel:
"Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques"
Sprache des Titels:
Englisch
Englischer Titel:
Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques
Erscheinungsjahr:
1997
Notiz zum Zitat:
A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev, A.O. Kosogov, P. Werner: "Structural characterization of self-assembled quantum dot structures by x-ray diffraction techniques", Thin Solid Films, 306, 198-204 (1997), ISSN-Number 0040-6090
ISSN:
0040-6090
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-