G. Abstreiter, Günther Bauer, A. A. Darhuber, G. Grübel, Vaclav Holy, I. Kegel, Z. Kovats, Till Hartmut Metzger, P. Schittenhelm, Julian Stangl,
"Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods"
, 1998, A.A. Darhuber, V. Holy, P. Schittenhelm, J. Stangl, I.Kegel, Z. Kovats, T.H. Metzger, G. Bauer, G. Abstreiter, G. Grübel: "Structural characterization of self-assembled Ge dot mulilayers by x-ray diffraction and reflectivity methods", Physica E, 2, 789-793 (1998), ISSN No. 1386-9477
Original Titel:
Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods
Sprache des Titels:
Englisch
Englischer Titel:
Structural characterization of self-assembled Ge dot mulilayers by x-ray diffraction and reflectivity methods
Erscheinungsjahr:
1998
Notiz zum Zitat:
A.A. Darhuber, V. Holy, P. Schittenhelm, J. Stangl, I.Kegel, Z. Kovats, T.H. Metzger, G. Bauer, G. Abstreiter, G. Grübel: "Structural characterization of self-assembled Ge dot mulilayers by x-ray diffraction and reflectivity methods", Physica E, 2, 789-793 (1998), ISSN No. 1386-9477
Anzahl der Seiten:
0
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-