Patrick Gruener, Yingjun Zhao, Martin Schagerl,
"Characterization of the spatial elastoresistivity of inkjet-printed carbon nanotube thin films for strain-state sensing"
, in H. Felix Wu et al.: Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure, Vol. 10169, Society of Photo-Optical Instrumentation Engineers (SPIE), 2017
Original Titel:
Characterization of the spatial elastoresistivity of inkjet-printed carbon nanotube thin films for strain-state sensing
Sprache des Titels:
Englisch
Original Buchtitel:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure
Original Kurzfassung:
Carbon nanotube (CNT)-embedded polymer solution can be inkjet-printed into a thin sheet consisting uniform
morphology and consistent electrical properties. When subjected to a loading scheme, the thin film's inherent electrical property changes in tandem with the
deformation. This unique property makes CNT thin films the appropriate candidate for strain sensing applications. Recent studies on characterizing the gage factor
of CNT-embedded thin films are limited to learning the materials resistance change along the loading direction only. However, research interests on strain measurement
of a structure have shifted from point-based interrogation to spatial strain-state monitoring. In this study an attempt to characterize its anisotropic resistivity was
carried out. The resistivity-strain constitutional relation of an inkjet-printed CNT thin film is established based on theories for semi-conductive materials.
The 2D elastoresistivity properties were characterized via the Montgomery method. It is observed that the change in resistivity in both directions are exhibiting
linear trend to their strains in the same direction, but the thin film is more sensitive toward compressive strains. The final result of this study has inspired future
research on fully characterizing the thin film's elastoresistivity under different loading situations, and the way to characterize shear elastoresistivity shall also be
reconsidered.
Sprache der Kurzfassung:
Englisch
Veröffentlicher:
Society of Photo-Optical Instrumentation Engineers (SPIE)