Andreas Rauchenecker, Robert Wille,
"An Efficient Physical Design of Fully-testable BDD-based Circuits"
: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Seite(n) 6-11, 2017
Original Titel:
An Efficient Physical Design of Fully-testable BDD-based Circuits
Sprache des Titels:
Englisch
Original Buchtitel:
International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Original Kurzfassung:
For the manufacturing test of ASICs, it is important
to reach a high test coverage in order to get the defect level as low as possible. However, complex digital circuits are usually
not fully testable. In order to address that, previous work suggested to realize the circuits by means of
Binary Decisions Diagrams
(BDDs). Here, each node is implemented using
multiplexer gates
(MUX gates) which, with some minor additions,
yield 100% testable circuits, with respect to stuck-at and path
delay faults. Unfortunately, current physical implementations of
MUX gates are rather expensive with respect to propagation
delay, power consumption, or transistor count. Hence, despite
the prospect of gaining 100% testability, BDD-based circuits did
not find significant attention yet. In this work, we propose an
alternative realization of MUX gates based on pass transistor
logic which addresses these drawbacks. Experiments show that
this allows for the realization of fully testable BDD-based circuits
which are competitive to or, in many cases, even better than state-
of-the-art realizations.
Forschungs-