Publikationsdetails

Zitat:	A. Alejo-Molina, H. Hardhienata, P.A. Márquez-Aguilar, Kurt Hingerl, "Facet-dependent electric-field-induced second harmonic generation in silicon and zincblende" , in Journal of the Optical Society of America B: Optical Physics, Vol. 34, Iss. 6, Seite(n) 1107-1114, 2017, ISSN: 1520-8540
Original Titel:	Facet-dependent electric-field-induced second harmonic generation in silicon and zincblende
Sprache des Titels:	Englisch
Original Kurzfassung:	We discuss electric-field-induced second harmonic (EFISH) generation for silicon and zincblende facets (001), (011), and (111), employing the full fourth-rank tensor representation of the third-order susceptibility. Then we directly relate these 81 tensor elements with the contracted or Voigt matrix representation. Using group theory, we show that the number of independent elements is only two; however, at different facets, different linear combinations thereof appear. Also, specific expressions for the resulting ? - and ?-polarized second harmonic polarization are given for incident ?- and ?-polarizations, for the first time explaining the facet and angle of incidence dependence of EFISH. Finally, a classical oscillator model is used to explain the response of the electrons and the material combined with a direct physical interpretation of the breaking of the symmetry and thus the deformation of the electronic charge density along the bonds. Through this model we propose a connection between the strength parameter ? for third harmonic generation and the second harmonic signal originated by EFISH mechanism. © 2017 Optical Society of America
Sprache der Kurzfassung:	Englisch
Journal:	Journal of the Optical Society of America B: Optical Physics
Volume:	34, Iss. 6
Seitenreferenz:	1107-1114
Erscheinungsjahr:	2017
ISSN:	1520-8540
Anzahl der Seiten:	8
DOI:	10.1364/JOSAB.34.001107
Reichweite:	international
Publikationstyp:	Aufsatz / Paper in SCI-Expanded-Zeitschrift
Autoren:	A. Alejo-Molina, H. Hardhienata, P.A. Márquez-Aguilar, Kurt Hingerl
Forschungseinheiten:	Zentrum für Oberflächen- und Nanoanalytik

Wissenschaftsgebiete:	Physik, Astronomie (ÖSTAT:103) Oberflächenphysik (ÖSTAT:103020) Optik (ÖSTAT:103021) Nanotechnologie (ÖSTAT:210006)

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