Günther Bauer, A. A. Darhuber, N. Darowski, Vaclav Holy, D. Lübbert, P. Mikulik, U. Pietsch, Friedrich Schäffler, Julian Stangl, Stefan Zerlauth, Y. Zhuang,
"Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction"
, in Journal of Applied Physics, 1999, "Y. Zhuang, V. Holy, J. Stangl, A.A. Darhuber, P. Mikulik, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch: "Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction", J. Phys. D (Applied Physics) 32, A224-A229 (1999)"
Original Titel:
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction
Sprache des Titels:
Englisch
Journal:
Journal of Applied Physics
Erscheinungsjahr:
1999
Notiz zum Zitat:
"Y. Zhuang, V. Holy, J. Stangl, A.A. Darhuber, P. Mikulik, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch: "Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction", J. Phys. D (Applied Physics) 32, A224-A229 (1999)"
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift