Sebastian Pointner, Robert Wille,
"Efficient Post-Silicon Run-Time Error Detection for Systems-on-Chip (Extended Abstract)"
: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 2021
Original Titel:
Efficient Post-Silicon Run-Time Error Detection for Systems-on-Chip (Extended Abstract)
Sprache des Titels:
Englisch
Original Buchtitel:
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
Original Kurzfassung:
Embedded systems have become very important
components in many safety-critical areas. Because of that,
methods that ensure a correct design and execution of those
systems are crucial. How to guarantee that also after deployment
remains a challenging task. Current state-of-the-art solutions try
to address this problem by adding redundant hardware and
comparing the respectively obtained results. However, although
such methods are commonly used in industry, they lead to
embedded systems with huge additional costs with respect to size,
power consumption, and delay. In this work, we are proposing
a methodology for error detection after deployment that works
without this overhead. To this end, we utilize techniques for
program analysis which allows for extracting information that
can be used by the embedded system to check whether it is still
in a correct state. Case studies conducted within an industrial
environment confirmed the benefits of the proposed methodology.
Forschungs-