Renate Hiesgen, M. Krause, Dieter Meissner,
"STM measurement of current - potential curves at a semiconductor surface"
, in Electrochimica Acta , 8-2000, ISSN: 0013-4686, STM measurement of current - potential curves at a semiconductor surface, R. Hiesgen, M. Krause, D. Meissner, Electrochimica Acta 45 (2000) 3213-3223
Original Titel:
STM measurement of current - potential curves at a semiconductor surface
Sprache des Titels:
Englisch
Journal:
Electrochimica Acta
Erscheinungsmonat:
8
Erscheinungsjahr:
2000
Notiz zum Zitat:
STM measurement of current - potential curves at a semiconductor surface, R. Hiesgen, M. Krause, D. Meissner, Electrochimica Acta 45 (2000) 3213-3223