Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits
Sprache des Vortragstitels:
Englisch
Original Tagungtitel:
Conference on Reversible Computation
Sprache des Tagungstitel:
Englisch
Original Kurzfassung:
Logical reversibility is the basis for emerging technologies like
quantum computing, may be used for certain aspects of low-power design,
and has been proven beneficial for the design of encoding/decoding
devices. Testing of circuits has been a major concern to verify the integrity
of the implementation of the circuit. In this paper, we propose
the main ideas of an ATPG method for detecting two missing gate faults.
To that effect, we propose a systematic flow using Binary Decision Diagrams
(BDDs). Initial experimental results demonstrate the efficacy
of the proposed algorithms in terms of scalability and coverage of all
testable faults.
Forschungs-