Sample position determination method for direct H-field measurement
Sprache des Vortragstitels:
Englisch
Original Tagungtitel:
SMM 26
Sprache des Tagungstitel:
Englisch
Original Kurzfassung:
This work proposes a novel approach to increase the accuracy of the tangential H-Field determination when using the direct method to
extrapolate the field on the surface of a soft magnetic material sample, eg. inline single sheet. An analytical model is introduced to calculate the
relative positioning of the sensor array to the sample. The analytical results are then verified using finite element simulations as well as
measurements with two different single sheet tester setups with variable sample to sensor positioning.
Sprache der Kurzfassung:
Englisch
Englischer Vortragstitel:
Sample position determination method for direct H-field measurement